Dimension FastScan™ 原子力显微镜 (AFM)在不损失Dimension® Icon®超高的分辨率和**的仪器性能前提下，**限度的提高了成像速度。这项突破性的技术创新，从根本上解决了AFM成像速度慢的难题，大大缩短了各技术水平的AFM用户获得数据的时间。 为提高AFM使用效率和检测 ...

The atomic force microscope (AFM) was invented five years after the scanning tunnelling microscope (STM), but it has since become the most widely used form of scanning probe microscopy.

SPM techniques share the common approach of scanning a probe over a specimen's surface to gather information. While STM provides unparalleled atomic-resolution images of conductive and semiconductive ...

Four STM tips are offered as standard; optionally, any number of these probes can be positioned anywhere between one and four and can be transformed in vacuum to AFM-qPlus sensor for use on conductive ...