Insights into the material’s particle size and size distribution are necessary for quality control and product development as both these parameters exhibit an effect on the processability as well as ...
Malvern Instruments has published a new application note examining the use of NanoSight Nanoparticle Tracking Analysis (NTA) ...
Interphex 2011 will be held at New York’s Jacob K. Javits Convention Center on 29-31 March 2011. More than 650 suppliers and 1,000 product lines will fill the show floor’s four exhibit zones. In ...
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