echo "10-epsilon_subsampling DONE." ...

Abstract As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex ...

CICFIM Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, San Nicolás de los Garza, Nuevo León 66450, México ...

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...

Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106319, Taiwan ...

Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

如果您希望可以时常见面，欢迎标星收藏哦 ~ 对电子元件三维 ( 3D ) 集成的需求正在稳步增长。尽管存在巨大的加工挑战，硅通孔 ( TSV ) 技术仍是集成 3D 格式单晶器件元件的唯一可行方法。尽管单片 3D ( M3D：monolithic ...

School of Chemistry and Biochemistry/Institute of Paper Science and Technology, Georgia Institute of Technology, 10 th St. NW, Atlanta, GA, 30318, USA ...

Our main tools are the various computer codes for the electronic structure, based mainly on the density-functional theory (DFT), including first-principles molecular dynamics, quantum transport, ...