To accelerate the wafer fabrication process and reduce waste, Chromasens has launched a machine vision system that detects cosmetic defects on silicon ... today's smaller chipsets require a higher ...

Inspection microscope for large samples such as a 300 mm semiconductor wafer or 17-inch flat-panel display. Uses a clutch-driven manual XY stage. This optional loader accessory for the MX61 (not ...

The Fraunhofer Institute for Photonic Microsystems (IPMS) and South Korean semiconductor equipment manufacturer NextIn have entered into an agreement to evaluate a new wafer defect inspection system.